Measurements and metrology

We have a number of different measurement techniques available.

• Access to several magnetometers for measurement of magnetic properties.
• Magnetoresistance and ferromagnetic resonance.
• Access to several metrology tools.
• Assist with x-ray diffraction of polycrystalline thin films.
• Scanning Electron Microscope pictures.

We have a very diverse set of tools available, so do not hesitate if you have a measurement need.

info@nanosc.se